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ORCIDMuhammad Bashir
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2020 – today
- 2021
[j12]Muhammad Bashir
, Jian Zhou, Bashir Bala Muhammad:
Optimal Supervisory Control for Flexible Manufacturing Systems Model With Petri Nets: A Place-Transition Control. IEEE Access 9: 58566-58578 (2021)- 2020
- [j11]Xun Li, Dandan Wu, Jingjing He, Muhammad Bashir, Liping Ma:
An Improved Method of Particle Swarm Optimization for Path Planning of Mobile Robot. J. Control. Sci. Eng. 2020: 3857894:1-3857894:12 (2020) - [j10]Muhammad Bashir:
Optimal enforcement of liveness for decentralized systems of flexible manufacturing systems using Petri nets. Trans. Inst. Meas. Control 42(12): 2206-2220 (2020)
2010 – 2019
- 2018
- [j9]Muhammad Bashir, Zhiwu Li, Murat Uzam, Naiqi Wu, Abdulrahman Al-Ahmari:
On structural reduction of liveness-enforcing Petri net supervisors for flexible manufacturing systems: an algebraic approach. IMA J. Math. Control. Inf. 35(4): 1217-1249 (2018) - 2017
- [j8]Muhammad Bashir, Zhiwu Li, Murat Uzam, Abdulrahman Al-Ahmari, Naiqi Wu, Ding Liu, Ting Qu:
A Minimal Supervisory Structure to Optimally Enforce Liveness on Petri Net Models for Flexible Manufacturing Systems. IEEE Access 5: 15731-15749 (2017) - 2015
- [j7]Shazia Bashir, Muhammad Bashir, Xavier Casadevall i Solvas, Julia M. Rees, William B. Zimmerman:
Hydrophilic Surface Modification of PDMS Microchannel for O/W and W/O/W Emulsions. Micromachines 6(10): 1445-1458 (2015) - 2014
- [j6]Chang-Chih Chen, Muhammad Bashir, Linda S. Milor, Daehyun Kim, Sung Kyu Lim:
Simulation of system backend dielectric reliability. Microelectron. J. 45(10): 1327-1334 (2014) - [j5]Muhammad Muqarrab Bashir, Chang-Chih Chen, Linda Milor, Dae Hyun Kim, Sung Kyu Lim:
Backend Dielectric Reliability Full Chip Simulator. IEEE Trans. Very Large Scale Integr. Syst. 22(8): 1750-1762 (2014) - 2011
- [j4]Muhammad Bashir, Linda Milor, Dae Hyun Kim, Sung Kyu Lim:
Impact of irregular geometries on low-k dielectric breakdown. Microelectron. Reliab. 51(9-11): 1582-1586 (2011) - 2010
- [j3]Muhammad Bashir, Linda S. Milor, Dae Hyun Kim, Sung Kyu Lim:
Methodology to determine the impact of linewidth variation on chip scale copper/low-k backend dielectric breakdown. Microelectron. Reliab. 50(9-11): 1341-1346 (2010) - [c1]Muhammad Bashir, Linda S. Milor:
Towards a chip level reliability simulator for copper/low-k backend processes. DATE 2010: 279-282
2000 – 2009
- 2009
- [j2]Muhammad Bashir, Linda Milor:
Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements. IEEE Des. Test Comput. 26(6): 18-27 (2009) - [j1]Muhammad Bashir, Linda S. Milor:
A methodology to extract failure rates for low-k dielectric breakdown with multiple geometries and in the presence of die-to-die linewidth variation. Microelectron. Reliab. 49(9-11): 1096-1102 (2009)
Coauthor Index
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