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E. Worley

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2001
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Steven H. Voldman, W. Anderson, R. Ashton, M. Chaine, Charvaka Duvvury, T. Maloney, E. Worley:
A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies. Microelectron. Reliab. 41(3): 335-348 (2001)

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