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2020 – today
- 2024
[j8]Jeonghyeon Choi
, Youbean Kim:
Low Loss Hybrid-Plane PCB Structure for Improving Signal Quality in High-Speed Signal Transmission. IEEE Access 12: 6413-6422 (2024)- [j7]Saúl Montalván, Pablo Arcos, Pablo Sarzosa, Richard Alejandro Rocha, Sang Guun Yoo, Youbean Kim:
Technologies and Solutions for Cattle Tracking: A Review of the State of the Art. Sensors 24(19): 6486 (2024)
2010 – 2019
- 2010
- [j6]Youbean Kim, Jaewon Jang, Hyunwook Son, Sungho Kang:
Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method. IEICE Trans. Inf. Syst. 93-D(3): 643-646 (2010)
2000 – 2009
- 2008
- [j5]Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang:
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Trans. Electron. 91-C(4): 670-672 (2008) - [j4]Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang:
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. IEICE Trans. Inf. Syst. 91-D(4): 1185-1188 (2008) - [j3]Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang:
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. IEICE Trans. Electron. 91-C(10): 1713-1716 (2008) - 2007
- [j2]Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang:
A New Analog-to-Digital Converter BIST Considering a Transient Zone. IEICE Trans. Electron. 90-C(11): 2161-2163 (2007) - [j1]Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang:
Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. IET Comput. Digit. Tech. 1(4): 369-376 (2007) - 2006
- [c2]Youbean Kim, Dongsup Song, Kicheol Kim, Incheol Kim, Sungho Kang:
TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. ATS 2006: 17-24 - 2005
- [c1]Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang:
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. Asian Test Symposium 2005: 230-235
Coauthor Index
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