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Hassan Ihs
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2010 – 2019
- 2018
- [c8]Arnaud Toni, Hassan Ihs, Taner Dosluoglu
, Remy Cellier, Nacer Abouchi:
An integrated 10MHz 3 States Buck converter for fast transient response in 180nm CMOS. DCIS 2018: 1-4 - 2011
- [c7]Emmanuel Hardy
, Hassan Ihs, Christian Dufaza, Stéphane Meillére, Rachid Bouchakour:
A partial tree vector quantizer dynamic element matching technique for audio Δ-Σ converters. CICC 2011: 1-4
1990 – 1999
- 1998
- [c6]Hassan Ihs, Karim Arabi, Bozena Kaminska:
Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulation. ICCD 1998: 40-46 - [c5]Karim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska:
Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100 - 1997
- [c4]Hassan Ihs, Christian Dufaza:
Test synthesis for DC test of switched-capacitors circuits. ED&TC 1997: 616 - [c3]Christian Dufaza, Hassan Ihs:
Test Synthesis for DC Test and Maximal Diagnosis of Switched-Capacitor Circuits. VTS 1997: 252-260 - 1996
- [j1]Christian Dufaza, Hassan Ihs:
A BIST-DFT technique for DC test of analog modules. J. Electron. Test. 9(1-2): 117-133 (1996) - [c2]Christian Dufaza, Hassan Ihs, Nico Verzijp:
Design and experimental results of a built-in voltage sensor for mixed signal testing. ICECS 1996: 1206-1209 - 1995
- [c1]Hassan Ihs, Christian Dufaza:
Tolerance DC bands of CMOS operational amplifier. Asian Test Symposium 1995: 140-
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