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"Accounting for inherent circuit resilience and process variations in ..."

Jianxin Fang, Sachin S. Sapatnekar (2011)

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DOI: 10.1109/ASPDAC.2011.5722275

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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  - https://dblp.org/rec/conf/aspdac/FangS11
Jianxin Fang, Sachin S. Sapatnekar:
Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability. ASP-DAC 2011: 689-694

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