"Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential ..."

Toshinori Hosokawa et al. (1999)

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DOI: 10.1109/ATS.1999.810750

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Toshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara:
Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. Asian Test Symposium 1999: 192-

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