"A Test Generation Method for Data Paths Using Easily Testable Functional ..."

Tetsuya Masuda et al. (2015)

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DOI: 10.1109/ATS.2015.14

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tetsuya Masuda, Jun Nishimaki, Toshinori Hosokawa, Hideo Fujiwara:
A Test Generation Method for Data Paths Using Easily Testable Functional Time Expansion Models and Controller Augmentation. ATS 2015: 37-42

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