"A New Sharpness Measure Based on Gaussian Lines and Edges."

Judith Dijk et al. (2003)

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DOI: 10.1007/978-3-540-45179-2_19

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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  dblp key:
  - conf/caip/DijkGAVV03
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  - https://dblp.org/rec/conf/caip/DijkGAVV03
Judith Dijk, Michael van Ginkel, Rutger J. van Asselt, Lucas J. van Vliet, Piet W. Verbeek:
A New Sharpness Measure Based on Gaussian Lines and Edges. CAIP 2003: 149-156

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