"Simulation-free estimation of speed degradation in NMOS self-testing ..."

Andrzej Krasniewski, Alexander Albicki (1985)

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DOI: 10.1145/317825.318001

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Andrzej Krasniewski, Alexander Albicki:
Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications. DAC 1985: 808-811

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