"Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies."

Georges G. E. Gielen et al. (2008)

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DOI: 10.1109/DATE.2008.4484862

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría:
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327

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