"Bias Temperature Instability analysis of FinFET based SRAM cells."

Seyab Khan et al. (2014)

> Home

Details and statistics

DOI: 10.7873/DATE.2014.044

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

- view
  authority control:
- export record
  dblp key:
  - conf/date/KhanAHKKRC14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/KhanAHKKRC14
Seyab Khan, Innocent Agbo, Said Hamdioui, Halil Kukner, Ben Kaczer, Praveen Raghavan, Francky Catthoor:
Bias Temperature Instability analysis of FinFET based SRAM cells. DATE 2014: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.