"Estimation of Electromigration-Aggravating Narrow Interconnects Using a ..."

Rani S. Ghaida, Payman Zarkesh-Ha (2007)

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DOI: 10.1109/DFT.2007.12

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Rani S. Ghaida, Payman Zarkesh-Ha:
Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model. DFT 2007: 59-67

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