"Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Paradigm."

Horng-Bin Wang, Shi-Yu Huang, Jing-Reng Huang (2002)

> Home

Details and statistics

DOI: 10.1109/DFTVS.2002.1173508

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/dft/WangHH02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dft/WangHH02
Horng-Bin Wang, Shi-Yu Huang, Jing-Reng Huang:
Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Paradigm. DFT 2002: 117-128

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.