"Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs."

Krishna Pradeep et al. (2018)

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DOI: 10.1109/ESSDERC.2018.8486847

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Krishna Pradeep, Theano A. Karatsori, Thierry Poiroux, Andre Juge, Patrick Scheer, Gilles Gouget, Emmanuel Josse, Gérard Ghibaudo:
Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs. ESSDERC 2018: 242-245

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