"An efficient testing methodology for embedded flash memories."

Suren Martirosyan et al. (2017)

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DOI: 10.1109/EWDTS.2017.8110074

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/ewdts/MartirosyanHSZ17
Suren Martirosyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Yervant Zorian:
An efficient testing methodology for embedded flash memories. EWDTS 2017: 1-4

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