"Mitigating the Effect of Reliability Soft-errors of RRAM Devices on the ..."

Amr M. S. Tosson et al. (2017)

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DOI: 10.1145/3060403.3060431

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei:
Mitigating the Effect of Reliability Soft-errors of RRAM Devices on the Performance of RRAM-based Neuromorphic Systems. ACM Great Lakes Symposium on VLSI 2017: 53-58

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