"Smart-Inspect: Micro Scale Localization and Classification of Smartphone ..."

M. Usman Maqbool Bhutta et al. (2020)

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DOI: 10.1109/IROS45743.2020.9341509

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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M. Usman Maqbool Bhutta, Shoaib Aslam, Peng Yun, Jianhao Jiao, Ming Liu:
Smart-Inspect: Micro Scale Localization and Classification of Smartphone Glass Defects for Industrial Automation. IROS 2020: 2860-2865

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