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"Excellent Reliability performances of a truly 5V nBOXFET for Automotive ..."

D. Lipp et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117689

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/LippZKAEBEHS23
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  - https://dblp.org/rec/conf/irps/LippZKAEBEHS23
D. Lipp, Z. Zhao, G. Krause, Wafa Arfaoui, Elodie Ebrard, Germain Bossu, S. Evseev, Markus Herklotz, Mahesh Siddabathula:
Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications. IRPS 2023: 1-5

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