"Post-acquisition image based compensation for thickness variation in ..."

Philipp Hanslovsky, John A. Bogovic, Stephan Saalfeld (2015)

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DOI: 10.1109/ISBI.2015.7163922

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-29

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Philipp Hanslovsky, John A. Bogovic, Stephan Saalfeld:
Post-acquisition image based compensation for thickness variation in microscopy section series. ISBI 2015: 507-511

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