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"A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm ..."

Choongyeun Cho et al. (2007)

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DOI: 10.1109/ISQED.2007.8

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/isqed/ChoKKPLCT07
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  persistent URL:
  - https://dblp.org/rec/conf/isqed/ChoKKPLCT07
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski:
A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology. ISQED 2007: 699-702

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