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ORCID"2008 IEEE International Test Conference, ITC 2008, Santa Clara, ..."
Douglas Young, Nur A. Touba (2008)
- Douglas Young, Nur A. Touba:
2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. IEEE Computer Society 2008, ISBN 978-1-4244-2403-0 [contents]
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