"Case study of scan chain diagnosis and PFA on a low yield wafer."

Yu Huang et al. (2010)

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DOI: 10.1109/TEST.2010.5699310

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen:
Case study of scan chain diagnosis and PFA on a low yield wafer. ITC 2010: 818

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