"The Leading Edge of Production Wafer Probe Test Technology."

William R. Mann et al. (2004)

> Home

Details and statistics

DOI: 10.1109/TEST.2004.1387391

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/MannTSB04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/MannTSB04
William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz:
The Leading Edge of Production Wafer Probe Test Technology. ITC 2004: 1168-1195

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.