"Prototyping memristors in digital system with an FPGA-based testing ..."

Daniel Wust et al. (2017)

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DOI: 10.1109/PATMOS.2017.8106978

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Daniel Wust, Mehrdad Biglari, Johannes Knödtel, Marc Reichenbach, Christopher Söll, Dietmar Fey:
Prototyping memristors in digital system with an FPGA-based testing environment. PATMOS 2017: 1-7

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