"Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated ..."

Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes (2006)

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DOI: 10.1109/VLSISOC.2006.313253

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes:
Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. VLSI-SoC 2006: 314-319

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