"Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects ..."

Felipe Lavratti et al. (2015)

> Home

Details and statistics

DOI: 10.1109/VLSID.2015.74

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/vlsid/LavrattiPVCM15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vlsid/LavrattiPVCM15
Felipe Lavratti, Letícia Maria Bolzani Poehls, Fabian Vargas, Andrea Calimera, Enrico Macii:
Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs. VLSID 2015: 405-410

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.