"An Ultra-Low Voltage Auger-Recombination Enhanced Hot Hole Injection ..."

T. C. Kao et al. (2024)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46783.2024.10631412

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type: Conference or Workshop Paper

metadata version: 2024-10-17

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T. C. Kao, M. J. Huang, Y. R. Liu, Y. K. Wang, J. C. Guo, Steve S. Chung:
An Ultra-Low Voltage Auger-Recombination Enhanced Hot Hole Injection Scheme in Implementing a 3 Bits per Cell e-DRAM CIM Macro for Inference Accelerator. VLSI Technology and Circuits 2024: 1-2

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