"Hot-Carrier-Degradation Characterization for Accurate End-of-Life ..."

Seongkyung Kim et al. (2024)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46783.2024.10631477

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type: Conference or Workshop Paper

metadata version: 2024-10-17

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Seongkyung Kim, Junkyo Jeong, Eunyu Choi, Jinyoung Kim, Hyewon Shim, Shin-Young Chung, Paul Jung:
Hot-Carrier-Degradation Characterization for Accurate End-of-Life Prediction with 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FET. VLSI Technology and Circuits 2024: 1-2

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