"Aging monitor reuse for small delay fault testing."

Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich (2017)

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DOI: 10.1109/VTS.2017.7928921

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich:
Aging monitor reuse for small delay fault testing. VTS 2017: 1-6

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