"IEEE Std 1500 Enables Modular SoC Testing."

Erik Jan Marinissen, Yervant Zorian (2009)

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DOI: 10.1109/MDT.2009.12

access: closed

type: Journal Article

metadata version: 2020-05-17

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Erik Jan Marinissen, Yervant Zorian:
IEEE Std 1500 Enables Modular SoC Testing. IEEE Des. Test Comput. 26(1): 8-17 (2009)

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