"An improved pattern match method with flexible mask for automatic ..."

Chern-Sheng Lin et al. (2009)

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DOI: 10.1016/J.ESWA.2008.01.035

access: closed

type: Journal Article

metadata version: 2017-05-26

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  - https://dblp.org/rec/journals/eswa/LinHLWWL09
Chern-Sheng Lin, Kuo-Hon Huang, Yun-Long Lay, Kuo-Chun Wu, Yieng-Chiang Wu, Jim-Min Lin:
An improved pattern match method with flexible mask for automatic inspection in the LCD manufacturing process. Expert Syst. Appl. 36(2): 3234-3239 (2009)

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