"Low-Area Wrapper Cell Design for Hierarchical SoC Testing."

Kyuchull Kim, Kewal K. Saluja (2009)

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DOI: 10.1007/S10836-009-5117-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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Kyuchull Kim, Kewal K. Saluja:
Low-Area Wrapper Cell Design for Hierarchical SoC Testing. J. Electron. Test. 25(6): 347-352 (2009)

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