"Identifying Resistive Open Defects in Embedded Cells under Variations."

Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich (2023)

> Home

Details and statistics

DOI: 10.1007/S10836-023-06044-Z

access: open

type: Journal Article

metadata version: 2023-05-17

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/et/NajafiHaghiW23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/NajafiHaghiW23
Zahra Paria Najafi-Haghi, Hans-Joachim Wunderlich:
Identifying Resistive Open Defects in Embedded Cells under Variations. J. Electron. Test. 39(1): 27-40 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.