"Datapath BIST Insertion Using Pre-Characterized Area and Testability Data."

Jiang Chau Wang et al. (2004)

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DOI: 10.1023/B:JETT.0000039602.34708.B2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Jiang Chau Wang, Paulo Sérgio Cardoso, Jose Artur Quilici González, Marius Strum, Ricardo Pires:
Datapath BIST Insertion Using Pre-Characterized Area and Testability Data. J. Electron. Test. 20(4): 333-344 (2004)

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