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"Iterative Exhaustive Pattern Generation for Logic Testing."

Donald T. Tang, C. L. Chen (1984)

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DOI: 10.1147/RD.282.0212

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/ibmrd/TangC84
Donald T. Tang, C. L. Chen:
Iterative Exhaustive Pattern Generation for Logic Testing. IBM J. Res. Dev. 28(2): 212-219 (1984)

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