"A Novel Pattern Run-Length Coding Method for Test Data Compression."

Diancheng Wu et al. (2013)

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DOI: 10.1587/TRANSELE.E96.C.1201

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/WuLZWH13
Diancheng Wu, Yu Liu, Hao Zhu, Donghui Wang, Chengpeng Hao:
A Novel Pattern Run-Length Coding Method for Test Data Compression. IEICE Trans. Electron. 96-C(9): 1201-1204 (2013)

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