"An on-chip glitchy-clock generator for testing fault injection attacks."

Sho Endo et al. (2011)

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DOI: 10.1007/S13389-011-0022-Y

access: closed

type: Journal Article

metadata version: 2022-08-26

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Sho Endo, Takeshi Sugawara, Naofumi Homma, Takafumi Aoki, Akashi Satoh:
An on-chip glitchy-clock generator for testing fault injection attacks. J. Cryptogr. Eng. 1(4): 265-270 (2011)

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