"A software defect prediction method with metric compensation based on ..."

Jinfu Chen et al. (2022)

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DOI: 10.1631/FITEE.2100468

access: closed

type: Journal Article

metadata version: 2022-08-16

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Jinfu Chen, Xiaoli Wang, Saihua Cai, Jiaping Xu, Jingyi Chen, Haibo Chen:
A software defect prediction method with metric compensation based on feature selection and transfer learning. Frontiers Inf. Technol. Electron. Eng. 23(5): 715-731 (2022)

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