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"Electrical characterization and TCAD simulations of multi-gate bulk nMOSFET."

Inga Zbierska et al. (2015)

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DOI: 10.1016/J.MEJO.2015.03.018

access: closed

type: Journal Article

metadata version: 2024-05-07

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  - https://dblp.org/rec/journals/mj/ZbierskaMCFL15
Inga Zbierska, Liviu Militaru, Françis Calmon, Sylvain Feruglio, Guo-Neng Lu:
Electrical characterization and TCAD simulations of multi-gate bulk nMOSFET. Microelectron. J. 46(7): 588-592 (2015)

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