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"Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect ..."

Eleni Chatzikyriakou, William Redman-White, C. H. De Groot (2017)

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DOI: 10.1016/J.MICROREL.2016.11.007

access: open

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/ChatzikyriakouR17
Eleni Chatzikyriakou, William Redman-White, C. H. De Groot:
Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node. Microelectron. Reliab. 68: 21-29 (2017)

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