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"Study for the non-contact characterization of metallization ageing of ..."

Tien Anh Nguyen et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.02.002

access: closed

type: Journal Article

metadata version: 2022-12-07

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Tien Anh Nguyen, Pierre-Yves Joubert, Stéphane Lefebvre, G. Chaplier, Lionel Rousseau:
Study for the non-contact characterization of metallization ageing of power electronic semiconductor devices using the eddy current technique. Microelectron. Reliab. 51(6): 1127-1135 (2011)

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