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"Test efficiency analysis of random self-test of sequential circuits."
Sarma Sastry, Amitava Majumdar (1991)
- Sarma Sastry, Amitava Majumdar:
Test efficiency analysis of random self-test of sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(3): 390-398 (1991)
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