"A BNF-based automatic test program generator for compatible microprocessor ..."

Lieh-Ming Wu, Kuochen Wang, Chuang-Yi Chiu (2004)

> Home

Details and statistics

DOI: 10.1145/966137.966142

access: closed

type: Journal Article

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/todaes/WuWC04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/todaes/WuWC04
Lieh-Ming Wu, Kuochen Wang, Chuang-Yi Chiu:
A BNF-based automatic test program generator for compatible microprocessor verification. ACM Trans. Design Autom. Electr. Syst. 9(1): 105-132 (2004)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.