"Modeling and analysis of correlated software failures of multiple types."

Yuan-Shun Dai, Min Xie, Kim-Leng Poh (2005)

> Home

Details and statistics

DOI: 10.1109/TR.2004.841709

access: closed

type: Journal Article

metadata version: 2020-07-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/DaiXP05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/DaiXP05
Yuan-Shun Dai, Min Xie, Kim-Leng Poh:
Modeling and analysis of correlated software failures of multiple types. IEEE Trans. Reliab. 54(1): 100-106 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.