"A concurrent built-in self-test architecture based on a self-testing RAM."

Ioannis Voyiatzis et al. (2005)

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DOI: 10.1109/TR.2004.842091

access: closed

type: Journal Article

metadata version: 2020-10-26

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Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis:
A concurrent built-in self-test architecture based on a self-testing RAM. IEEE Trans. Reliab. 54(1): 69-78 (2005)

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