"Statistical Models of Overdispersed Spatial Defects for Predicting the ..."

Tao Yuan, Suk Joo Bae, Yue Kuo (2020)

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DOI: 10.1109/TR.2019.2943925

access: closed

type: Journal Article

metadata version: 2020-07-09

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Tao Yuan, Suk Joo Bae, Yue Kuo:
Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits. IEEE Trans. Reliab. 69(2): 510-521 (2020)

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