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"Effects of Depth Variation of Substrate Dopant Impurity Concentration on ..."
Cheng-Sheng Pan (1986)
- Cheng-Sheng Pan:
Effects of Depth Variation of Substrate Dopant Impurity Concentration on the Interface Trap Density Determination in Mos Devices (Semiconductor). University of Illinois Urbana-Champaign, USA, 1986
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