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2020 – today
- 2024
[c2]Ruihan Li, Fangdan Ye, Yifei Yuan, Ruizhen Yang, Bingchuan Tian, Tianchen Guo, Hao Wu, Xiaobo Zhu, Zhongyu Guan, Qing Ma, Xianlong Zeng, Chenren Xu, Dennis Cai, Ennan Zhai:
Reasoning about Network Traffic Load Property at Production Scale. NSDI 2024- [c1]Ruihan Li
, Yifei Yuan, Fangdan Ye, Mengqi Liu, Ruizhen Yang, Yang Yu, Tianchen Guo, Qing Ma, Xianlong Zeng, Chenren Xu, Dennis Cai, Ennan Zhai:
A General and Efficient Approach to Verifying Traffic Load Properties under Arbitrary k Failures. SIGCOMM 2024: 228-243 - 2021
- [j7]Hong Zhang, Ruizhen Yang, Wenhui Chen, Ruikun Wu:
Metal Detection of Wood Based on Thermal Signal Reconstruction Algorithm. J. Sensors 2021: 1-8 (2021) - [j6]Ruikun Wu, Hong Zhang, Ruizhen Yang, Wenhui Chen, Guo-Tai Chen:
Nondestructive Testing for Corrosion Evaluation of Metal under Coating. J. Sensors 2021: 6640406:1-6640406:16 (2021) - 2020
- [j5]Ruizhen Yang, Bolun Du, Puhong Duan, Yunze He, Hongjin Wang, Yigang He, Kai Zhang:
Electromagnetic Induction Heating and Image Fusion of Silicon Photovoltaic Cell Electrothermography and Electroluminescence. IEEE Trans. Ind. Informatics 16(7): 4413-4422 (2020)
2010 – 2019
- 2018
- [j4]Yunze He, Ruizhen Yang, Xuan Wu, Shoudao Huang:
Dynamic Scanning Electromagnetic Infrared Thermographic Analysis Based on Blind Source Separation for Industrial Metallic Damage Evaluation. IEEE Trans. Ind. Informatics 14(12): 5610-5619 (2018) - [j3]Ruizhen Yang, Yunze He, Andreas Mandelis, Nichen Wang, Xuan Wu, Shoudao Huang:
Induction Infrared Thermography and Thermal-Wave-Radar Analysis for Imaging Inspection and Diagnosis of Blade Composites. IEEE Trans. Ind. Informatics 14(12): 5637-5647 (2018) - 2017
- [j2]Hong Zhang, Ruizhen Yang, Yunze He, Ali Foudazi, Liang Cheng, Guiyun Tian:
A Review of Microwave Thermography Nondestructive Testing and Evaluation. Sensors 17(5): 1123 (2017) - 2015
- [j1]Yunze He, Ruizhen Yang:
Eddy Current Volume Heating Thermography and Phase Analysis for Imaging Characterization of Interface Delamination in CFRP. IEEE Trans. Ind. Informatics 11(6): 1287-1297 (2015)
Coauthor Index
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