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ORCIDAndrew Richardson 0001
Person information
- affiliation: Lancaster University, Centre for Microsystems Engineering, UK
Other persons with the same name
- Andrew Richardson — disambiguation page
- Andrew Richardson 0002 (aka: Andrew Ross Richardson) — University of Michigan, Department of Computer Science and Engineering, Ann Arbor, MI, USA (and 1 more)
- Andrew Richardson 0003 (aka: Andrew Grant Richardson) — University of Sunderland, School of Computer Science, UK
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2010 – 2019
- 2019
[c25]Andrew Richardson
, David Cheneler:
Self-Monitoring, Self-Healing Biomorphic Sensor Technology. IOLTS 2019: 121-124- 2013
- [c24]Qais Al-Gayem, Hong Liu, Haroon Khan, Andrew Richardson:
Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems. IOLTS 2013: 133-138 - 2011
- [j11]Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd:
Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems. J. Electron. Test. 27(1): 57-68 (2011) - [j10]Qais Al-Gayem, Andrew Richardson, Hongyuan Liu, Nick Burd:
An Oscillation-Based Technique for Degradation Monitoring of Sensing and Actuation Electrodes Within Microfluidic Systems. J. Electron. Test. 27(3): 375-387 (2011) - 2010
- [c23]Z. Xu, Andrew Richardson, Lijie Li, Mark L. Begbie, D. Koltsov, C. H. Wang:
A multi-mode MEMS sensor design to support system test and health & usage monitoring applications. ETS 2010: 263 - [c22]Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd, M. Kumar:
An on-line monitoring technique for electrode degradation in bio-fluidic microsystems. ITC 2010: 654-663
2000 – 2009
- 2009
- [j9]Marcelo Lubaszewski, Andrew Richardson, C. C. Su:
Guest editorial. Microelectron. J. 40(7): 1041 (2009) - [c21]Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd:
Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems. ETS 2009: 73-78 - 2008
- [j8]Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson:
Online Testing of MEMS Based on Encoded Stimulus Superposition. J. Electron. Test. 24(6): 555-566 (2008) - [j7]Hans G. Kerkhoff, Xiao Zhang, Frédérick Mailly, Pascal Nouet, Hongyuan Liu, Andrew Richardson:
A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data. VLSI Design 2008: 437879:1-437879:9 (2008) - [c20]Norbert Dumas, Florence Azaïs, Frédérick Mailly, Andrew Richardson, Pascal Nouet:
A novel method for test and calibration of capacitive accelerometers with a fully electrical setup. DDECS 2008: 304-309 - [i2]Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson:
Online Sensor Testing through Superposition of Encoded Stimulus. CoRR abs/0802.3101 (2008) - 2007
- [j6]Marcelo Lubaszewski, Andrew Richardson, C. C. Su:
Guest Editorial. J. Electron. Test. 23(6): 469 (2007) - [c19]Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson:
A Novel Approach for Online Sensor Testing Based on an Encoded Test Stimulus. ETS 2007: 105-110 - [i1]Carl Jeffrey, Reuben Cutajar, Stephen Prosser, M. Lickess, Andrew Richardson, Stephen Riches:
The Integration of On-Line Monitoring and Reconfiguration Functions using EDAA - European design and Automation Association1149.4 Into a Safety Critical Automotive Electronic Control Unit. CoRR abs/0710.4826 (2007) - 2006
- [j5]Salvador Mir, Kwang-Ting (Tim) Cheng, Andrew Richardson:
Guest Editorial. J. Electron. Test. 22(4-6): 311 (2006) - [j4]Kostas Georgopoulos, Andreas Lechner, Martin John Burbidge, Andrew Richardson:
Investigation into the Use of Hybrid Solutions for SigmaDelta A/D Converter Testing. J. Electron. Test. 22(4-6): 359-370 (2006) - 2005
- [j3]Carl Jeffrey, Reuben Cutajar, Andrew Richardson, Stephen Prosser, M. Lickess, Stephen Riches:
The Integration of On-Line Monitoring and Reconfiguration Functions into a Safety Critical Automotive Electronic Control Unit. J. Electron. Test. 21(4): 405-416 (2005) - [c18]Carl Jeffrey, Reuben Cutajar, Stephen Prosser, M. Lickess, Andrew Richardson, Stephen Riches:
The Integration of On-Line Monitoring and Reconfiguration Functions using IEEE1149.4 Into a Safety Critical Automotive Electronic Control Unit. DATE 2005: 153-158 - [c17]Carl Jeffrey, Zhou Xu, Andrew Richardson:
Bias Superposition - An On-Line Test Strategy for a MEMS Based Conductivity Sensor. ETS 2005: 88-93 - 2003
- [j2]Martin John Burbidge, Frédéric Poullet, Jim Tijou, Andrew Richardson:
Investigations for Minimum Invasion Digital Only Built-In "Ramp" Based Test Techniques for Charge Pump PLL's. J. Electron. Test. 19(4): 481-490 (2003) - [c16]Martin John Burbidge, Jim Tijou, Andrew Richardson:
Techniques for Automatic On Chip Closed Loop Transfer Function Monitoring For Embedded Charge Pump Phase Locked Loops. DATE 2003: 10496-10503 - 2002
- [c15]Martin John Burbidge, Frédéric Poullet, Jim Tijou, Andrew M. D. Richardson:
Investigations for minimum invasion digital only built-in "ramp" based test techniques for charge pump PLL's. ETW 2002: 95-102 - 2001
- [c14]Andreas Lechner, Andrew Richardson, B. Hermes:
Short Circuit Faults in State-of-the-Art ADCs - Are They Hard or Soft? Asian Test Symposium 2001: 417-422 - [c13]Andreas Lechner, Andrew Richardson, B. Hermes:
Towards a better understanding of failure modes and test requirements of ADCs. DATE 2001: 803 - [c12]Andreas Lechner, Martin John Burbidge, Andrew Richardson, B. Hermes:
3DB Challange for DfT, DfM, DOT & BIST Integration into Analogue and Mixed Signal ICs. LATW 2001: 194-199
1990 – 1999
- 1999
- [c11]Andreas Lechner, J. Ferguson, Andrew Richardson, B. Hermes:
A Digital Partial Built-In Self-Test for a High Performance Automatic Gain Control Circuit . DATE 1999: 232-238 - 1998
- [c10]Juan A. Prieto, Adoración Rueda, Ian Andrew Grout, Eduardo J. Peralías, José L. Huertas, Andrew Mark David Richardson:
An Approach to Realistic Fault Prediction and Layout Design for Testability in Analog Circuits. DATE 1998: 905-909 - [c9]Andrew Richardson, Andreas Lechner, Thomas Olbrich:
Design for testability strategies for mixed signal & analogue designs-from layout to system. ICECS 1998: 425-432 - [c8]Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson:
Testing MEMS. VTS 1998: 320-321 - [c7]Andreas Lechner, Andrew Richardson, B. Hermes, Michael J. Ohletz:
A Design for Testability Study on a High Performance Automatic Gain Control Circuit. VTS 1998: 376-385 - 1997
- [c6]Thomas Olbrich, Ian Andrew Grout, Y. Eben Aimine, Andrew Mark David Richardson, Jean-Noël Contensou:
A new quality estimation methodology for mixed-signal and analogue ICs. ED&TC 1997: 573-580 - 1996
- [j1]Thomas Olbrich, Andrew Richardson:
Design and Self-Test for Switched-Current Building Blocks. IEEE Des. Test Comput. 13(2): 10-17 (1996) - [c5]Thomas Olbrich, Jordi Pérez, Ian Andrew Grout, Andrew Mark David Richardson, Carles Ferrer:
Defect-Oriented vs. Schematic-Level Based Fault Simulation for Mixed-Signal ICs. ITC 1996: 511-520 - 1995
- [c4]A. H. Bratt, Andrew Mark David Richardson, R. J. A. Harvey, A. P. Dorey:
A design-for-test structure for optimising analogue and mixed signal IC test. ED&TC 1995: 24-33 - 1994
- [c3]Keith Baker, A. H. Bratt, Andrew Richardson, A. Welbers:
Development of a CLASS 1 QTAG Monitor. ITC 1994: 213-222 - [c2]R. J. A. Harvey, Andrew Mark David Richardson, Eric Bruls, Keith Baker:
Analogue Fault Simulation Based on Layout-Dependent Fault Models. ITC 1994: 641-649
1980 – 1989
- 1988
- [c1]A. P. Dorey, B. K. Jones, Andrew Mark David Richardson, P. C. Russell, Y. Z. Xu:
Reliability Testing by Precise Electrical Measurement. ITC 1988: 369-373
Coauthor Index
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