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ORCIDNicola Trivellin
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2020 – today
- 2022
[j16]Irene Cappelli
, Ada Fort, Alessandro Pozzebon, Marco Tani, Nicola Trivellin, Valerio Vignoli, Mara Bruzzi:
Autonomous IoT Monitoring Matching Spectral Artificial Light Manipulation for Horticulture. Sensors 22(11): 4046 (2022)- 2021
- [j15]Nicola Trivellin, Matteo Buffolo, Carlo De Santi, Matteo Meneghini, Michele Forzan, Fabrizio Dughiero, Enrico Zanoni, Gaudenzio Meneghesso:
Full Optical Contactless Thermometry Based on LED Photoluminescence. IEEE Trans. Instrum. Meas. 70: 1-8 (2021) - [c2]Nicola Trivellin, Matteo Buffolo, Carlo De Santi, Enrico Zanoni, Gaudenzio Meneghesso, Matteo Meneghini:
Current crowding as a major cause for InGaN LED degradation at extreme high current density. IECON 2021: 1-6
2010 – 2019
- 2018
- [j14]Nicola Trivellin, Desiree Monti, Carlo De Santi, Matteo Buffolo, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
Current induced degradation study on state of the art DUV LEDs. Microelectron. Reliab. 88-90: 868-872 (2018) - [j13]Nicola Trivellin, Diego Barbisan, Denis Badocco, Paolo Pastore, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni, Giuseppe Belgioioso, Angelo Cenedese:
Study and Development of a Fluorescence Based Sensor System for Monitoring Oxygen in Wine Production: The WOW Project. Sensors 18(4): 1130 (2018) - 2015
- [c1]Nicola Trivellin, Matteo Meneghini, Marco Ferretti, Diego Barbisan, Matteo Dal Lago, Gaudenzio Meneghesso, Enrico Zanoni:
Effects and exploitation of tunable white light for circadian rhythm and human-centric lighting. RTSI 2015: 154-156 - 2014
- [j12]Matteo Meneghini, Simone Vaccari, Matteo Dal Lago, Stefano Marconi, Marco Barbato, Nicola Trivellin, Alessio Griffoni, Alberto Alfier, Giovanni Verzellesi, Gaudenzio Meneghesso, Enrico Zanoni:
ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements. Microelectron. Reliab. 54(6-7): 1143-1149 (2014) - [j11]Matteo Dal Lago, Matteo Meneghini, Carlo De Santi, Marco Barbato, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni:
ESD on GaN-based LEDs: An analysis based on dynamic electroluminescence measurements and current waveforms. Microelectron. Reliab. 54(9-10): 2138-2141 (2014) - [j10]Carlo De Santi, Matteo Meneghini, Michael Marioli, Matteo Buffolo, Nicola Trivellin, T. Weig, K. Holc, K. Köhler, J. Wagner, U. T. Schwarz, Gaudenzio Meneghesso, Enrico Zanoni:
Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage. Microelectron. Reliab. 54(9-10): 2147-2150 (2014) - 2013
- [j9]Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
"Hot-plugging" of LED modules: Electrical characterization and device degradation. Microelectron. Reliab. 53(9-11): 1524-1528 (2013) - [j8]Carlo De Santi, Matteo Meneghini, S. Carraro, Simone Vaccari, Nicola Trivellin, Stefania Marconi, Michael Marioli, Gaudenzio Meneghesso, Enrico Zanoni:
Variations in junction capacitance and doping activation associated with electrical stress of InGaN/GaN laser diodes. Microelectron. Reliab. 53(9-11): 1534-1537 (2013) - 2012
- [j7]Matteo Meneghini, Matteo Dal Lago, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
Chip and package-related degradation of high power white LEDs. Microelectron. Reliab. 52(5): 804-812 (2012) - [j6]Matteo Meneghini, Matteo Dal Lago, L. Rodighiero, Nicola Trivellin, Enrico Zanoni, Gaudenzio Meneghesso:
Reliability issues in GaN-based light-emitting diodes: Effect of dc and PWM stress. Microelectron. Reliab. 52(8): 1621-1626 (2012) - [j5]Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
Phosphors for LED-based light sources: Thermal properties and reliability issues. Microelectron. Reliab. 52(9-10): 2164-2167 (2012) - 2011
- [b1]Nicola Trivellin:
Extensive study of reliability and performance of next generation GaN light emitting devices. University of Padua, Italy, 2011 - [j4]Matteo Dal Lago, Matteo Meneghini, Nicola Trivellin, Gaudenzio Meneghesso, Enrico Zanoni:
Degradation mechanisms of high-power white LEDs activated by current and temperature. Microelectron. Reliab. 51(9-11): 1742-1746 (2011) - [j3]Nicola Trivellin, Matteo Meneghini, Carlo De Santi, Simone Vaccari, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, S. Takigawa, Tsuyoshi Tanaka, Daisuke Ueda:
Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency. Microelectron. Reliab. 51(9-11): 1747-1751 (2011) - 2010
- [j2]Matteo Meneghini, Nicola Trivellin, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda, Enrico Zanoni, Gaudenzio Meneghesso:
Reliability evaluation for Blu-Ray laser diodes. Microelectron. Reliab. 50(4): 467-470 (2010)
2000 – 2009
- 2009
- [j1]Nicola Trivellin, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda:
Reliability analysis of InGaN Blu-Ray laser diode. Microelectron. Reliab. 49(9-11): 1236-1239 (2009)
Coauthor Index
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